The RL78 process is inherently highly robust against noise, and combined with embedded noise filtering features and the ability to use peripheral registers to stop clock supply to hardware not being used, this has produced some very impressive noise robustness results on first RL78/I1A silicon.

TEG (Test Evaluation Group) chip evaluation achieved the best possible Class III results against the Generic IC EMC Test Specification Version 1.2, meaning low application EMC effort required (versus Class I - high EMC effort required and Class II - medium EMC effort required).

The TEG chip data shown in the figure below based on:

- Global Pin: Carries a signal or power which enters or leaves the application board.

- Local Pin: Carries a signal or power which does not leave the application board.