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DAC1627D1G25 - Dual 16-bit DAC with LVDS Interface

NXP DAC1627D1G25 icon

The DAC1627D1G25 from NXP is a 16-bit dual-channel Digital-to-Analog Converter (DAC) with selectable 2x, 4x and 8x interpolating filters optimized for multi-carrier and broad band wireless transmitters at sample rates up to 1.25 Gsps. Supplied from 3.3 V and 1.8 V power sources, it integrates a differential scalable output current up to 31.8 mA.

The mixer frequency is set by a high resolution 40-bit Numerically Controlled Oscillator (NCO). High resolution internal gain, phase and offset control provide outstanding image and LO rejection at the system analog modulator output.

An inverse (sin x)/x function ensures controlled flatness at the DAC output. The LVDS DDR receiver interface allows a high data bandwidth (312.5 MS/sec) at the input.

DAC1627D1G25 Features & Benefits

  • Dual 16-bit resolution
  • 1.25 Gsps maximum update rate
  • Selectable x2, x4 and x8 interpolation filters
  • Very low noise capacitor-free integrated Phase Locked Loop (PLL)
  • Embedded Numerically Controlled Oscillator (NCO) with 40-bit programmable frequency
  • Embedded complex modulator
  • 1.8 V and 3.3 V power supplies
  • LVDS DDR compatible input interface with on-chip 100 Ω terminations
  • LVDS DDR input clock up to 312.5 MHz
  • LVDS or LVPECL compatible DAC clock
  • Interleaved or folded I and Q data input mode
  • Synchronization of multiple DAC devices
  • 3 or 4 wires mode SPI interface
  • Differential scalable output current from 6.95...31.8 mA
  • External analog offset control (10-bit auxiliary DACs)
  • High resolution internal digital gain and offset control
  • Internal phase correction
  • Inverse (sin x) / x function
  • Power-down mode and sleep mode
  • On-chip 1.25 V reference

DAC1627D1G25 Applications

  • Wireless infrastructure: MG_GSM, LTE, WiMAX, GSM, CDMA, WCDMA, TD-SCDMA
  • Communication: LMDS/MMDS, point-to-point
  • Direct Digital Synthesis (DDS)
  • Broadband wireless systems
  • Digital radio links
  • Instrumentation
  • Automated Test Equipment (ATE)

DAC1627D1G25 Block Diagram
NXP DAC1627D1G25 bd
NXP 150px

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